Development of Integration-Type Silicon-On-Insulator Monolithic Pixel Detectors by Using a Float Zone Silicon

TL;DR

This paper reports on the development and testing of monolithic SOI pixel detectors using Float Zone silicon, highlighting recent progress and performance comparisons with Czochralski silicon detectors for X-ray and charged particle detection.

Contribution

It introduces a new FZ SOI pixel detector, compares its performance with Cz SOI detectors, and demonstrates advancements in monolithic detector technology.

Findings

FZ SOI detectors show comparable or improved performance over Cz detectors.

Successful fabrication and testing of FZ SOI pixel detectors since 2011.

Enhanced X-ray imaging capabilities with the new FZ SOI technology.

Abstract

In this paper, we describe the development of monolithic pixel detectors by using a Silicon-on-Insulator (SOI) technology for X-ray and charged particle applications. The detectors are based on a 0.2 {\mu}m CMOS fully depleted SOI process (Lapis Semiconductor Co., Ltd). The SOI wafer consists of a thick high-resistivity substrate for sensing and a thin low resistivity Si layer for CMOS circuits. We developed the integration-type SOI pixel detector, INTPIX4 mainly for X-ray imaging; it is made of a Float Zone (FZ) or Czochralski (Cz) silicon wafer. Since 2005, Cz SOI detectors were used initially. After 2011, FZ SOI detectors were successfully fabricated. In this paper, we state recent progresses and test results of the SOI monolithic pixel detector using a FZ silicon and compare them with the results obtained using the Cz detector.