Lateral position correction in ptychography with sub-pixel accuracy

TL;DR

This paper presents a straightforward method for correcting probe positions in ptychography with sub-pixel accuracy, enhancing image reconstruction quality, supported by simulations and experiments with visible light.

Contribution

The work introduces a new approach for precise probe position correction in ptychography, improving reconstruction accuracy beyond previous methods.

Findings

Sub-pixel probe position correction is achievable with the proposed method.

The approach improves reconstruction quality in both simulations and experiments.

Experimental validation confirms effectiveness with visible light data.

Abstract

Ptychography, a form of Coherent Diffractive Imaging, is used with short wavelengths (e.g. X-rays, electron beams) to achieve high-resolution image reconstructions. One of the limiting factors for the reconstruction quality is the accurate knowledge of the illumination probe positions. Recently, many advances have been made to relax the requirement for the probe positions accuracy. Here, we analyze and demonstrate a straightforward approach that can be used to correct the probe positions with sub-pixel accuracy. Simulations and experimental results with visible light are presented in this work.