Testing the capability of low-energy light ions identification of the TRACE silicon detectors

TL;DR

This study evaluates the ability of TRACE silicon detectors to identify low-energy light ions, specifically heavy-ion reaction products around 10 MeV, using digital and analog read-out methods with pulse shape analysis.

Contribution

It demonstrates the capability and limitations of TRACE silicon detectors in identifying light ions at low energies, highlighting the impact of alpha contamination on detection thresholds.

Findings

Successful charge and mass separation at low energies.

Alpha contamination limits identification to energies above ~20 MeV.

Digital pulse shape analysis enhances particle identification.

Abstract

The in-beam tests of two Si pixel type TRACE detectors have been performed at Laboratori Nazionali di Legnaro (Italy). The aim was to investigate the possibility of identifying heavy-ion reactions products with mass A~10 at low kinetic energy, i.e., around 10 MeV. Two separate read-out chains, digital and analog, were used. The Pulse Shape Analysis technique was employed to obtain the identification matrices for the digitally processed part of the data. Separation in both charge and mass was obtained, however, the $\alpha$ particles contaminated significantly the recorded data in the lower energy part. Due to this effect, the identification of the light products ($^{7,6}$Li isotopes) could be possible down only to ~20 MeV