Stochastic Model of Breakdown Nucleation under Intense Electric Fields
Eliyahu Zvi Engelberg, Yinon Ashkenazy, Michael Assaf

TL;DR
This paper presents a stochastic model linking dislocation activity to electrical breakdown under intense fields, supported by simulations and theory, aligning with experimental data.
Contribution
It introduces a novel stochastic model of dislocation dynamics that explains breakdown nucleation under high electric fields, combining Monte Carlo simulations with theoretical analysis.
Findings
Breakdown rates depend on electric field in a simplified manner.
Model predictions align with experimental breakdown data.
Dislocation population transitions trigger protrusion formation leading to arcing.
Abstract
Plastic response due to dislocation activity under intense electric fields is proposed as a source of breakdown. A model is formulated based on stochastic multiplication and arrest under the stress generated by the field. A critical transition in the dislocation population is suggested as the cause of protrusion formation leading to subsequent arcing. The model is studied using Monte Carlo simulations and theoretical analysis, yielding a simplified dependence of the breakdown rates on the electric field. These agree with experimental observations of field and temperature breakdown dependencies.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
