Secondary ion mass spectrometry for SRF cavity materials

TL;DR

This paper discusses the application of secondary ion mass spectrometry (SIMS) as a robust characterization technique to better understand the relationship between processing, structure, and performance of SRF cavity materials, aiming to accelerate research.

Contribution

It introduces SIMS as an effective method for analyzing SRF materials and provides examples demonstrating its utility in SRF technology development.

Findings

SIMS reveals detailed material composition and structure.

Using SIMS improves understanding of processing-structure-performance links.

SIMS accelerates material development for SRF cavities.

Abstract

Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.