Ultra-efficient superconducting Dayem bridge field-effect transistor
Federico Paolucci, Giorgio De Simoni, Elia Strambini, Paolo Solinas,, and Francesco Giazotto

TL;DR
This paper reports the development of Ti-based Dayem bridge superconducting FETs that can fully suppress the critical current with low gate voltages, revealing a possible field-effect control mechanism in metallic superconductors.
Contribution
It demonstrates a novel fabrication of superconducting Dayem bridge FETs capable of controlling critical current, with insights into the field-effect modulation mechanism in metallic superconductors.
Findings
Complete suppression of critical current at low gate voltages
Increase in superconducting resistance near critical gate voltage
High transconductance and tunable Josephson inductance
Abstract
Superconducting field-effect transitor (SuFET) and Josephson field-effect transistor (JoFET) technologies take advantage of electric field induced control of charge carrier concentration in order to modulate the channel superconducting properties. Despite field-effect is believed to be unaffective for superconducting metals, recent experiments showed electric field dependent modulation of the critical current (IC) in a fully metallic transistor. Yet, the grounding mechanism of this phenomenon is not completely understood. Here, we show the experimental realization of Ti-based Dayem bridge field-effect transistors (DB-FETs) able to control IC of the superconducting channel. Our easy fabrication process DB-FETs show symmetric full suppression of IC for an applied critical gate voltage as low as VCG~+-8V at temperatures reaching about the 85% of the record critical temperature TC~550mK for…
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