Invariant properties of a locally salient dither pattern with a spatial-chromatic histogram
A. M. R. R. Bandara, L. Ranathunga, and N. A. Abdullah

TL;DR
This paper analyzes the rotational and scale invariance of a locally salient dither pattern feature combined with a spatial-chromatic histogram, demonstrating its robustness for visual depiction of both regular and irregular shapes.
Contribution
It introduces an analysis of invariance properties of a new feature combining dither patterns with a spatial-chromatic histogram, expanding its applicability in shape-based visual depiction.
Findings
The feature is rotationally invariant.
The feature is scale invariant.
Supported by experiments using SVM classifiers.
Abstract
Compacted Dither Pattern Code (CDPC) is a recently found feature which is successful in irregular shapes based visual depiction. Locally salient dither pattern feature is an attempt to expand the capability of CDPC for both regular and irregular shape based visual depiction. This paper presents an analysis of rotational and scale invariance property of locally salient dither pattern feature with a two dimensional spatialchromatic histogram, which expands the applicability of the visual feature. Experiments were conducted to exhibit rotational and scale invariance of the feature. These experiments were conducted by combining linear Support Vector Machine (SVM) classifier to the new feature. The experimental results revealed that the locally salient dither pattern feature with the spatialchromatic histogram is rotationally and scale invariant.
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