Unsupervised Phase Mapping of X-ray Diffraction Data by Nonnegative Matrix Factorization Integrated with Custom Clustering
Valentin Stanev, Velimir V. Vesselinov, A. Gilad Kusne, Graham, Antoszewski, Ichiro Takeuchi, Boian S. Alexandrov

TL;DR
This paper introduces an advanced method combining Nonnegative Matrix Factorization with custom clustering to analyze large X-ray diffraction datasets, enabling accurate phase identification and compositional mapping in materials science.
Contribution
It extends NMF analysis by integrating clustering and cross-correlation, allowing robust detection of peak-shifted patterns and improving phase diagram determination.
Findings
Successfully identified peak-shifted patterns in datasets
Accurately determined the number of basis patterns
Demonstrated robustness on synthetic and experimental data
Abstract
Analyzing large X-ray diffraction (XRD) datasets is a key step in high-throughput mapping of the compositional phase diagrams of combinatorial materials libraries. Optimizing and automating this task can help accelerate the process of discovery of materials with novel and desirable properties. Here, we report a new method for pattern analysis and phase extraction of XRD datasets. The method expands the Nonnegative Matrix Factorization method, which has been used previously to analyze such datasets, by combining it with custom clustering and cross-correlation algorithms. This new method is capable of robust determination of the number of basis patterns present in the data which, in turn, enables straightforward identification of any possible peak-shifted patterns. Peak-shifting arises due to continuous change in the lattice constants as a function of composition, and is ubiquitous in XRD…
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