Hybrid mean field and real space model for vacancy diffusion-mediated annealing of radiation defects

TL;DR

This paper presents a hybrid model combining mean field and real space approaches to predict vacancy diffusion and defect annealing in nuclear materials, accounting for undetectable radiation defects and their screening effects.

Contribution

It introduces a novel coupled mean field and real space model for defect evolution, including the effects of undetectable radiation defects and their screening on larger defect clusters.

Findings

Small defects screen interactions between larger clusters.

The model self-consistently simulates defect evolution.

Ewald summation used for defect interactions in thin films.

Abstract

In a fusion or advanced fission reactor, high energy neutrons induce the formation of extended defect clusters in structural component materials, degrading their properties over time. Such damage can be partially recovered via a thermal annealing treatment. Therefore, for the design and operation of fusion and advanced fission nuclear energy systems it is critical to estimate and predict the annealing timescales for arbitrary configurations of defect clusters. In our earlier paper [I. Rovelli, S. L. Dudarev, and A. P. Sutton, J. Mech. Phys. Solids 103, 121 (2017)] we extended the Green function formulation by Gu, Xiang et al. [Y. Gu, Y. Xiang, S. S. Quek, and D. J. Srolovitz, J. Mech. Phys. Solids 83, 319 (2015)] for the climb of curved dislocations, to include the evaporation and growth of cavities and vacancy clusters, and take into account the effect of free surfaces. In this work, we further develop this model to include the effect of radiation defects that are below the experimental detection limit, via a mean field approach coupled with an explicit treatment of the evolution of discrete defect clusters distributed in real space. We show that randomly distributed small defects screen diffusive interactions between larger discrete clusters. The evolution of the coupled system is modelled self-consistently. We also simulate the evolution of defects in an infinite laterally extended thin film, using the Ewald summation of screened Yukawa-type diffusive propagators.