Waferscale Electrostatic Quadrupole Array for Multiple Ion Beam Manipulation
K. B. Vinayakumar, A. Persaud, P. A. Seidl, Q. Ji, W. L. Waldron, T., Schenkel, S. Ardanuc, and A. Lal

TL;DR
This paper introduces a wafer-scale silicon-based Electrostatic Quadrupole Array (ESQA) that can focus high-energy ion beams, enabling more compact and cost-effective charged particle accelerators through innovative micromachining and array design.
Contribution
It presents the first through-wafer silicon-based ESQA with scalable fabrication, demonstrating high-voltage operation and multi-beam focusing for wafer-based accelerator architectures.
Findings
Successfully fabricated wafer-scale ESQA capable of holding up to 1 kV in air.
Demonstrated focusing of 12 keV argon ion beams in a 3x3 array.
Showed potential for high current density and compact accelerator design.
Abstract
We report on the first through-wafer silicon-based Electrostatic Quadrupole Array (ESQA) to focus high energy ion beams. This device is a key enabler for a wafer based accelerator architecture that lends itself to orders-of-magnitude reduction in cost, volume and weight of charged particle accelerators. ESQs are a key building block in developing compact Multiple Electrostatic Quadrupole Array Linear Accelerator (MEQALAC) [1]. In a MEQALAC electrostatic forces are used to focus ions, and electrostatic field scaling permits high beam current densities by decreasing the beam aperture size for a given peak electric field set by breakdown limitations. Using multiple parallel beams, each totaling to an area A, can result in higher total beam current compared to a single aperture beam of the same area. Smaller dimensions also allow for higher focusing electric field gradients and therefore…
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Taxonomy
TopicsIon-surface interactions and analysis · Particle accelerators and beam dynamics · Plasma Diagnostics and Applications
