Asymmetric Electric Field Screening in van der Waals Heterostructures
Lu Hua Li, Tian Tian, Qiran Cai, Chih-Jen Shih, and Elton J. G. Santos

TL;DR
This study combines theoretical and experimental methods to reveal asymmetric electric field screening in MoS2/Graphene van der Waals heterostructures, highlighting thickness-dependent effects and interface dipolar contributions.
Contribution
It provides new insights into the intrinsic dielectric screening properties and asymmetric responses of vdW heterostructures, with implications for device engineering.
Findings
Asymmetric electric response observed under different field directions.
Screening is highly dependent on MoS2 layer thickness.
Interface dipolar contributions cause the asymmetric screening behavior.
Abstract
Electric field screening plays an important role in the physical and chemical properties of materials and their devices. Here, we use a compelling set of theoretical and experimental techniques involving van der Waals (vdW) ab initio density functional theory (DFT) simulations, quantum capacitance-based classical model and electric force microscopy (EFM) to elucidate the intrinsic dielectric screening properties of vdW heterostructures (vdWHs) formed by MoS2 and graphene layers. We experimentally observed an asymmetric electric response in the MoS2/Graphene vdWHs under different directions of the external electric field. That is, when the electric fields are shed towards graphene, a large amount of polarized charges screen the fields, but as the sign of the field was reversed, a strong depolarization field was present, and a partial screening was detected. This effect is…
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