Characterizing Complementary Bipolar Junction Transistors by Early Modelling, Image Analysis, and Pattern Recognition
Luciano da F. Costa

TL;DR
This paper presents a comprehensive approach combining Early modeling, image analysis, and pattern recognition to characterize complementary bipolar junction transistors, revealing parameter distributions and their impact on circuit performance.
Contribution
It introduces a novel methodology integrating Early parameter estimation with image-based voting and pattern recognition to analyze complementary BJTs.
Findings
Complementary BJTs occupy a restricted Early parameter space.
NPN and PNP groups are mostly segregated in the Early space.
Parameter matching significantly influences harmonic distortion in push-pull circuits.
Abstract
This work reports an approach to study complementary pairs of bipolar junction transistors, often used in push-pull circuits typically found at the output stages of operational amplifiers. After the data is acquired and pre-processed, an Early modeling approach is applied to estimate the two respective parameters (the Early voltage and the proportionality parameter ). A voting procedure, inspired on the Hough transform image analysis method, is adopted to improve the identification of . Analytical relationships are derived between the traditional parameters current gain () and output resistance () and the two Early parameters. It is shown that tends to increase with for fixed , while depends only on , varying linearly with this parameter. Several interesting results are obtained with respect to 7 pairs of complementary BJTs, each…
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Taxonomy
TopicsNon-Destructive Testing Techniques · Integrated Circuits and Semiconductor Failure Analysis · Industrial Vision Systems and Defect Detection
