Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations
Maxim Ziatdinov, Ondrej Dyck, Artem Maksov, Xufan Li, Xiahan Sang, Kai, Xiao, Raymond R. Unocic, Rama Vasudevan, Stephen Jesse, Sergei V. Kalinin

TL;DR
This paper presents a deep learning method for analyzing atomically resolved microscopy images, enabling chemical identification and tracking of local atomic transformations without extensive prior knowledge.
Contribution
The authors develop a weakly-supervised deep neural network approach to identify atomic species and defects in microscopy images, including unseen defect types and dynamic transformations.
Findings
Successfully identified atomic species and defects in microscopy images.
Tracked complex atomic and defect transformations over time.
Demonstrated scalability and human-like reasoning in data analysis.
Abstract
Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various functional properties in real space with angstrom-level precision. This progress has been accompanied by an exponential increase in the size and quality of datasets produced by microscopic and spectroscopic experimental techniques. These developments necessitate adequate methods for extracting relevant physical and chemical information from the large datasets, for which a priori information on the structures of various atomic configurations and lattice defects is limited or absent. Here we demonstrate an application of deep neural networks to extract information from atomically resolved images including location of the atomic species and type of defects. We develop a 'weakly-supervised' approach that uses…
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