Frustrated Double Ionization of Argon Atoms in Strong Laser Fields

TL;DR

This study uses reaction microscopy to analyze frustrated double ionization of argon atoms in strong laser fields, revealing higher electron trapping probabilities and a transition from nonsequential to sequential ionization regimes.

Contribution

It provides the first kinematically complete measurements of frustrated double ionization, highlighting the role of sequential ionization at high laser intensities.

Findings

Higher electron trapping probability after double ionization compared to single ionization.

Clear transition from nonsequential to sequential ionization regimes.

Second electron significantly contributes to frustrated double ionization in the sequential regime.

Abstract

We demonstrate kinematically complete measurements on frustrated double ionization of argon atoms in strong laser fields with a reaction microscope. We found that the electron trapping probability after strong field double ionization is much higher than that after strong field single ionization, especially in case of high laser intensity. The retrieved electron momentum distributions of frustrated double ionization show a clear transition from the nonsequential to the sequential regime, similar to those of strong field double ionization. The dependence of electron momentum width on the laser intensity further indicates that the second released electron has a dominant contribution to frustrated double ionization in the sequential regime.