On Maximally Recoverable Codes for Product Topologies

TL;DR

This paper studies maximally recoverable codes for grid-like topologies, providing new constructions and characterizations of recoverable erasure patterns using graph matchings and tensor product techniques.

Contribution

It introduces a bipartite graph approach for product topologies and extends the analysis to cases with multiple local constraints, offering uniform proof techniques.

Findings

Existence of complete matchings in bipartite graphs for erasure patterns

Alternate proof of recoverability conditions for a=1, h=0

Characterization of recoverable patterns for a=2, h=0

Abstract

Given a topology of local parity-check constraints, a maximally recoverable code (MRC) can correct all erasure patterns that are information-theoretically correctable. In a grid-like topology, there are $a$ local constraints in every column forming a column code, $b$ local constraints in every row forming a row code, and $h$ global constraints in an $(m \times n)$ grid of codeword. Recently, Gopalan et al. initiated the study of MRCs under grid-like topology, and derived a necessary and sufficient condition, termed as the regularity condition, for an erasure pattern to be recoverable when $a=1, h=0$. In this paper, we consider MRCs for product topology ($h=0$). First, we construct a certain bipartite graph based on the erasure pattern satisfying the regularity condition for product topology (any $a, b$, $h=0$) and show that there exists a complete matching in this graph. We then present an alternate direct proof of the sufficient condition when $a=1, h=0$. We later extend our technique to study the topology for $a=2, h=0$, and characterize a subset of recoverable erasure patterns in that case. For both $a=1, 2$, our method of proof is uniform, i.e., by constructing tensor product $G_{\text{col}} \otimes G_{\text{row}}$ of generator matrices of column and row codes such that certain square sub-matrices retain full rank. The full-rank condition is proved by resorting to the matching identified earlier and also another set of matchings in erasure sub-patterns.