Impact of Small Phonon Energies on the Charge-Carrier Lifetimes in Metal-Halide Perovskites
Thomas Kirchartz, Tom Markvart, Uwe Rau, David A. Egger

TL;DR
This paper explores how low phonon energies in metal-halide perovskites influence charge-carrier recombination, revealing that such properties contribute to long lifetimes and high device efficiencies by reducing defect sensitivity.
Contribution
It provides a theoretical analysis linking low phonon energies to recombination dynamics and defect insensitivity in metal-halide perovskites.
Findings
Low phonon energies cause a strong dependence of recombination rates on trap position.
Perovskites with low phonon energies are less sensitive to midgap defects.
Long charge-carrier lifetimes are partly due to low phonon energies reducing non-radiative recombination.
Abstract
Solar cells based on metal-halide perovskite absorber layers have resulted in outstanding photovoltaic devices with long non-radiative lifetimes as a crucial feature enabling high efficiencies. Long non-radiative lifetimes occur if the transfer of the energy of the electron-hole pair into vibrational energy is slow, due to, e.g., a low density of defects, weak electron phonon coupling or the release of a large number of phonons needed for a single transition. Here, we discuss the implications of the known material properties of metal-halide perovskites (such as permittivities, phonon energies and effective masses) and combine those with basic models for electron-phonon coupling and multiphonon-transition rates in polar semiconductors. We find that the low phonon energies of MAPbI lead to a strong dependence of recombination rates on trap position, which can be readily deduced from…
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