Nanofabricated tips for device-based scanning tunneling microscopy

TL;DR

This paper introduces a novel nanofabricated silicon-based STM tip that integrates into electrical circuits, offering improved stability and resolution over traditional tips, with potential for advanced device applications.

Contribution

It presents a new fabrication method for silicon chip-based STM tips, demonstrating their high performance and potential for integration into electronic circuits.

Findings

Successfully fabricated silicon chip-based STM tips with defined apex.

Demonstrated high stability and resolution in imaging Au(111) surfaces.

Verified in situ tip preparation capability.

Abstract

We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called smart tips and show the possibility of device-based STM tips. Contrary to conventional etched metal wire tips, these can be integrated into lithographically defined electrical circuits. We describe a new fabrication method to create a defined apex on a silicon chip and experimentally demonstrate the high performance of the smart tips, both in stability and resolution. In situ tip preparation methods are possible and we verify that they can resolve the herringbone reconstruction and Friedel oscillations on Au(111) surfaces. We further present an overview of possible applications.