Stress-dependent electrical transport and its universal scaling in granular materials
Chongpu Zhai, Dorian Hanaor, Gw\'ena\"elle Proust, Yixiang Gan

TL;DR
This study reveals a universal stress-independent scaling law in the electrical response of granular materials, demonstrated through experiments and resistor-capacitor network modeling, emphasizing the role of contact interfaces and packing structure.
Contribution
It introduces a universal scaling framework for stress-dependent electrical transport in granular materials, supported by experimental data and network modeling that highlights contact and packing effects.
Findings
Spectra collapse onto a master curve under stress normalization.
Universal scaling governed by interfacial properties and network configuration.
Model reproduces experimental universal behavior across stress levels.
Abstract
We experimentally and numerically examine stress-dependent electrical transport in granular materials to elucidate the origins of their universal dielectric response. The ac responses of granular systems under varied compressive loadings consistently exhibit a transition from a resistive plateau at low frequencies to a state of nearly constant loss at high frequencies. By using characteristic frequencies corresponding to the onset of conductance dispersion and measured direct-current resistance as scaling parameters to normalize the measured impedance, results of the spectra under different stress states collapse onto a single master curve, revealing well-defined stress-independent universality. In order to model this electrical transport, a contact network is constructed on the basis of prescribed packing structures, which is then used to establish a resistor-capacitor network by…
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