Demonstration of a genetic-algorithm-optimized cavity-based waveguide crossing

TL;DR

This paper demonstrates a compact silicon photonics waveguide crossing optimized with a genetic algorithm, achieving low insertion loss and crosstalk, suitable for dense photonic integration.

Contribution

It introduces a novel cavity-based waveguide crossing optimized via genetic algorithms, improving performance metrics in silicon photonics.

Findings

Insertion loss of 0.1-0.3 dB per crossing

Crosstalk below -35 dB in 1550-1600 nm band

Footprint of 5 x 5 μm²

Abstract

A compact, single-etch silicon photonics waveguide crossing based on low quality factor cavity and optimized by a genetic algorithm is demonstrated. The device has 0.1~0.3 dB insertion loss and < -35 dB crosstalk per crossing for fundamental TE mode in the 1550-1600 nm wavelength band, with a footprint of 5 x 5 {\mu}m$^2$.