Zero-bias anomaly in nano-scale hole-doped Mott insulators on a triangular silicon surface
Fangfei Ming, Tyler S. Smith, Steven Johnston, Paul C. Snijders and, Hanno H. Weitering

TL;DR
This study investigates the zero-bias anomaly in nanoscale hole-doped Mott insulators on a silicon surface, revealing that the anomaly is mainly caused by a dynamical Coulomb blockade effect rather than superconductivity.
Contribution
It demonstrates that the zero-bias anomaly in nanoscale Mott insulators is primarily due to Coulomb blockade effects, with minimal influence from superconducting phenomena.
Findings
Zero-bias anomaly increases as domain size decreases.
Dynamical Coulomb blockade model fits the data better than superconductivity.
Oscillatory Coulomb staircase behavior observed in lightly-doped substrates.
Abstract
Adsorption of 1/3 monolayer of Sn on a heavily-doped p-type Si(111) substrate results in the formation of a hole-doped Mott insulator, with electronic properties that are remarkably similar to those of the high-Tc copper oxide compounds. In this work, we show that the maximum hole-density of this system increases with decreasing domain size as the area of the Mott insulating domains approaches the nanoscale regime. Concomitantly, scanning tunneling spectroscopy data at 4.4 K reveal an increasingly prominent zero bias anomaly (ZBA). We consider two different scenarios as potential mechanisms for this ZBA: chiral d_(x^2 -y^2 )+ id_xy wave superconductivity and a dynamical Coulomb blockade (DCB) effect. The latter arises due to the formation of a resistive depletion layer between the nano-domains and the substrate. Both models fit the tunneling spectra with weaker ZBAs, while the DCB model…
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