Memory-based Combination PUFs for Device Authentication in Embedded Systems

TL;DR

This paper introduces a novel combination PUF that merges SRAM and DRAM to enhance security, entropy, and reconfigurability for device authentication in embedded IoT systems, demonstrating robustness against attacks and environmental variations.

Contribution

It proposes a new memory-based combination PUF leveraging SRAM and DRAM, improving security, entropy, and reconfigurability over existing single-memory PUFs.

Findings

Achieves high entropy and large challenge-response space.

Resists various security attacks effectively.

Maintains 100% true-positive and 0% false-positive authentication rates across temperature and aging tests.

Abstract

Embedded systems play a crucial role in fueling the growth of the Internet-of-Things (IoT) in application domains such as healthcare, home automation, transportation, etc. However, their increasingly network-connected nature, coupled with their ability to access potentially sensitive/confidential information, has given rise to many security and privacy concerns. An additional challenge is the growing number of counterfeit components in these devices, resulting in serious reliability and financial implications. Physically Unclonable Functions (PUFs) are a promising security primitive to help address these concerns. Memory-based PUFs are particularly attractive as they require minimal or no additional hardware for their operation. However, current memory-based PUFs utilize only a single memory technology for constructing the PUF, which has several disadvantages including making them vulnerable to security attacks. In this paper, we propose the design of a new memory-based combination PUF that intelligently combines two memory technologies, SRAM and DRAM, to overcome these shortcomings. The proposed combination PUF exhibits high entropy, supports a large number of challenge-response pairs, and is intrinsically reconfigurable. We have implemented the proposed combination PUF using a Terasic TR4-230 FPGA board and several off-the-shelf SRAMs and DRAMs. Experimental results demonstrate substantial improvements over current memory-based PUFs including the ability to resist various attacks. Extensive authentication tests across a wide temperature range (20 - 60 deg. Celsius) and accelerated aging (12 months) demonstrate the robustness of the proposed design, which achieves a 100% true-positive rate and 0% false-positive rate for authentication across these parameter ranges.