The local geometry of testing in ellipses: Tight control via localized Kolmogorov widths
Yuting Wei, Martin J. Wainwright

TL;DR
This paper analyzes the local geometric complexity of testing mean vectors in high-dimensional ellipses, providing sharp bounds and revealing location-dependent rates that improve upon classical global results.
Contribution
It introduces localized minimax testing bounds using Kolmogorov widths and characterizes the optimal linear projection test for high-dimensional ellipse testing problems.
Findings
Derived sharp upper and lower bounds on localized minimax testing radius.
Revealed that testing rates vary depending on the location within the ellipse.
Identified the optimal linear projection test for these problems.
Abstract
We study the local geometry of testing a mean vector within a high-dimensional ellipse against a compound alternative. Given samples of a Gaussian random vector, the goal is to distinguish whether the mean is equal to a known vector within an ellipse, or equal to some other unknown vector in the ellipse. Such ellipse testing problems lie at the heart of several applications, including non-parametric goodness-of-fit testing, signal detection in cognitive radio, and regression function testing in reproducing kernel Hilbert spaces. While past work on such problems has focused on the difficulty in a global sense, we study difficulty in a way that is localized to each vector within the ellipse. Our main result is to give sharp upper and lower bounds on the localized minimax testing radius in terms of an explicit formula involving the Kolmogorov width of the ellipse intersected with a…
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Taxonomy
TopicsStatistical Methods and Inference · Advanced Statistical Methods and Models
