Quantitative imaging of anisotropic material properties with vectorial ptychography

TL;DR

This paper demonstrates a novel vectorial ptychography method capable of quantitatively mapping the four parameters of the Jones matrix, enabling detailed characterization of anisotropic optical materials in the visible spectrum.

Contribution

It introduces the first optical-range measurements of vectorial ptychography to quantify anisotropic material properties through Jones matrix mapping.

Findings

Successfully mapped the four Jones matrix parameters of anisotropic specimens.

Enabled quantification of optical properties like transmittance, retardance, and diattenuation.

Validated the method's capability to analyze complex optical anisotropies.

Abstract

Following the recent establishment of the formalism of vectorial ptychography [Ferrand et al., Opt. Lett. 40, 5144 (2015)], first measurements are reported in the optical range, demonstrating the capability of the proposed method to map the four parameters of the Jones matrix of an anisotropic specimen, and therefore to quantify a wide range of optical material properties, including power transmittance, optical path difference, diattenuation, retardance, and fast-axis orientation.