Continuous-Variable Entanglement Test in Driven Quantum Contacts

TL;DR

This paper develops a continuous-variable entanglement test for driven quantum contacts, overcoming limitations of traditional tests at finite temperatures, and demonstrates its violation under specific conditions.

Contribution

It introduces a novel entanglement test suitable for electrons and holes in ac-driven mesoscopic junctions, accounting for bidirectional particle flow.

Findings

Bell inequality violation in low conductance junctions

Test effectiveness with few electron-hole pairs per cycle

Dependence on pair creation probabilities and Fano factor

Abstract

The standard entanglement test using the Clauser-Horne-Shimony-Holt inequality is known to fail in mesoscopic junctions at finite temperatures. Since this is due to the bidirectional particle flow, a similar failure is expected to occur in an ac-driven contact. We develop a continuous-variable entanglement test suitable for electrons and holes that are created by the ac drive. The generalized Bell inequality is violated in junctions with low conductance or small number of transport channels and with ac voltages which create few electron-hole pairs per cycle. Our ac-entanglement test depends on the total number of electron-hole pairs and on the distribution of probabilities of pair creations similar to the Fano factor.