Logic Bug Detection and Localization Using Symbolic Quick Error Detection
Eshan Singh, David Lin, Clark Barrett, and Subhasish Mitra

TL;DR
This paper introduces Symbolic QED, a formal method combining software transformations and model checking to efficiently detect and localize logic bugs in complex SoC designs, significantly reducing analysis time and bug trace length.
Contribution
It presents a fully automatic, formal approach that improves bug detection and localization speed and accuracy without additional hardware, applicable to large-scale multicore chips.
Findings
Detects and localizes logic bugs in large SoCs effectively
Reduces bug activation trace length by up to 6 orders of magnitude
Requires only a few hours for analysis, unlike manual or traditional formal methods
Abstract
We present Symbolic Quick Error Detection (Symbolic QED), a structured approach for logic bug detection and localization which can be used both during pre-silicon design verification as well as post-silicon validation and debug. This new methodology leverages prior work on Quick Error Detection (QED) which has been demonstrated to drastically reduce the latency, in terms of the number of clock cycles, of error detection following the activation of a logic (or electrical) bug. QED works through software transformations, including redundant execution and control flow checking, of the applied tests. Symbolic QED combines these error-detecting QED transformations with bounded model checking-based formal analysis to generate minimal-length bug activation traces that detect and localize any logic bugs in the design. We demonstrate the practicality and effectiveness of Symbolic QED using the…
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