A High-Resolution Combined Scanning Laser- and Widefield Polarizing Microscope for Imaging at Temperatures from 4 K to 300 K

TL;DR

This paper introduces a high-resolution combined scanning laser and widefield polarizing microscope capable of imaging magnetic, structural, and electric properties of materials across a temperature range of 4 K to 300 K, suitable for advanced solid-state physics research.

Contribution

The paper presents a novel microscopy setup that integrates confocal laser and widefield polarizing microscopy with cryogenic and magnetic field capabilities, enabling multi-modal imaging of complex materials.

Findings

Achieves ~240 nm spatial resolution at 405 nm wavelength.

Operates effectively across 4 K to 300 K temperature range.

Allows imaging of magnetic, structural, and electric properties simultaneously.

Abstract

Polarized light microscopy, as a contrast-enhancing technique for optically anisotropic materials, is a method well suited for the investigation of a wide variety of effects in solid-state physics, as for example birefringence in crystals or the magneto-optical Kerr effect (MOKE). We present a microscopy setup that combines a widefield microscope and a confocal scanning laser microscope with polarization-sensitive detectors. By using a high numerical aperture objective, a spatial resolution of about 240 nm at a wavelength of 405 nm is achieved. The sample is mounted on a $^4$He continuous flow cryostat providing a temperature range between 4 K and 300 K, and electromagnets are used to apply magnetic fields of up to 800 mT with variable in-plane orientation and 20 mT with out-of-plane orientation. Typical applications of the polarizing microscope are the imaging of the in-plane and out-of-plane magnetization via the longitudinal and polar MOKE, imaging of magnetic flux structures in superconductors covered with a magneto-optical indicator film via Faraday effect or imaging of structural features, such as twin-walls in tetragonal SrTiO$_3$. The scanning laser microscope furthermore offers the possibility to gain local information on electric transport properties of a sample by detecting the beam-induced voltage change across a current-biased sample. This combination of magnetic, structural and electric imaging capabilities makes the microscope a viable tool for research in the fields of oxide electronics, spintronics, magnetism and superconductivity.