Accurate, rapid identification of dislocation lines in coherent diffractive imaging via a min-max optimization formulation
A. Ulvestad, M. Menickelly, S. M. Wild

TL;DR
This paper introduces a novel, derivative-free min-max optimization method for accurately and rapidly identifying 3D dislocation lines in nanocrystals using Bragg coherent x-ray diffractive imaging, outperforming existing techniques in speed and accuracy.
Contribution
The authors develop and validate a new min-max optimization approach that improves accuracy and efficiency in detecting dislocation lines in BCDI images, surpassing derivative-based and manual methods.
Findings
Achieves 260x faster processing speed.
Provides higher accuracy than existing methods.
Enables better defect imaging in nanomaterials.
Abstract
Defects such as dislocations impact materials properties and their response during external stimuli. Defect engineering has emerged as a possible route to improving the performance of materials over a wide range of applications, including batteries, solar cells, and semiconductors. Imaging these defects in their native operating conditions to establish the structure-function relationship and, ultimately, to improve performance has remained a considerable challenge for both electron-based and x-ray-based imaging techniques. However, the advent of Bragg coherent x-ray diffractive imaging (BCDI) has made possible the 3D imaging of multiple dislocations in nanoparticles ranging in size from 100 nm to1000 nm. While the imaging process succeeds in many cases, nuances in identifying the dislocations has left manual identification as the preferred method. Derivative-based methods are also used,…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
