Pure phase BiFeO$_3$ thin films sputtered over Si: A new route towards high magnetization
G. A. Gomez-Iriarte, C. Labre, L. A. S. de Oliveira, J. P. Sinnecker

TL;DR
This study introduces a novel sputtering method to produce pure phase BiFeO$_3$ thin films on silicon with high magnetization, highlighting the role of oxygen vacancies and surface effects in magnetic enhancement.
Contribution
The paper presents a new sputtering route for high-rate deposition of pure phase BiFeO$_3$ films on silicon, achieving high magnetization at room temperature.
Findings
High saturation magnetization (~165,000 A/m) achieved in BiFeO$_3$ films.
Oxygen vacancies and surface effects contribute to magnetic properties.
Films exhibit low surface roughness and are suitable for device integration.
Abstract
We have investigated the structural and magnetic properties of BiFeO (BFO) thin films grown over (100)-oriented Si substrates by rf magnetron sputtering in a new route under O free low pressure Ar atmosphere. Single-phase BFO films were deposited in a heated substrate and post-annealed in situ. The new routed allows high deposition rate and produce polycrystalline BFO pure phase, confirmed by high resolution X-ray diffraction. Scanning electron and atomic force microscopy reveal very low surface roughness and mean particle size of 33 nm. The BFO phase and composition were confirmed by transmission electron microscopy and line scanning energy-dispersive X-ray spectroscopy in transmission electron microscopy mode. The surface chemistry of the thin film, analyzed by X-ray photoelectron spectroscopy, reveals the presence of Fe and Fe in a 2:1 ratio, a strong indication…
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