Straightforward measurement of thermal properties of anisotropic materials: the case of Bi2Se3 single crystal

TL;DR

This paper presents a simple two-step optical measurement protocol to accurately determine both in-plane and out-of-plane thermal properties of anisotropic materials like Bi2Se3 single crystals, overcoming shape-related experimental challenges.

Contribution

The study introduces a novel, straightforward method combining thermoreflectance microscopy and layered sample analysis to measure anisotropic thermal conductivities.

Findings

Successfully measured in-plane and out-of-plane thermal conductivities of Bi2Se3

Validated the method with theoretical models showing good agreement

Provided precise thermal property values for Bi2Se3

Abstract

We show that by a simple two-steps measurement protocol one can extract the thermal properties of anisotropic insulator materials. We focus on Bi2Se3 single crystal, a layered crystal with individual sheets held together by Van der Waals force, presenting strong heat diffusion anisotropy. Since the shape of the sample does not allow experiments in the perpendicular direction the challenge is to measure the in plane and out of plane thermal properties by in plane measurements. The optical properties of Bi2Se3 being known (opaque sample for the pump and probe beams), thermoreflectance microscopy experiments can be done on the bare substrate. In this case, the lateral heat diffusion is governed by the in plane thermal diffusivity. A 100 nm gold layer is then deposited on the sample. In this second experiment it is straightforward to demonstrate that the perpendicular thermal properties of the layer rule the lateral diffusivity. The good agreement of theoretical curves obtained by thermal models with experimental data permit us to evaluate the thermal conductivity coefficients of bulk Bi2Se3.