Atomic force microscopy study of the tetragonal to monoclinic transformation behaviour of silica doped yttria-stabilized zirconia

TL;DR

This study uses atomic force microscopy to investigate how silica doping affects the phase transformation from tetragonal to monoclinic in yttria-stabilized zirconia, aiming to understand its transformation mechanism.

Contribution

It provides new insights into the transformation behavior of silica-doped zirconia using atomic force microscopy, complementing previous XRD studies.

Findings

Silica doping reduces residual stresses and slows transformation kinetics.

AFM reveals detailed transformation propagation mechanisms.

Silica-doped zirconia shows decreased susceptibility to phase transformation.

Abstract

The tetragonal to monoclinic phase transformation of zirconia has been the subject of extensive studies over the last 20 years [1-4]. The main features of the transformation have been identified and its martensitic nature is now widely recognised [5-8]. More specifically, the relevance of a nucleation and growth model to describe the transformation is widely accepted. Recent fracture episodes [9] of zirconia hip joint heads were reported, failures related to the t-m transformation degradation. Among the materials solutions considered for decreasing the sensitivity to t-m phase transformation, the possibility of adding silica as a dopant appears as an appealing one. Previous studies have revealed the beneficial effect of silica addition by the formation of a glassy phase at the grain boundaries and triple points. This glassy phase has been proven to reduce the residual stresses level [10], slowing down the transformation kinetics. Preliminary quantitative investigations by XRD have shown these materials are less susceptible to transformation. However, the mechanism by which the transformation propagated has still to be assessed.