Chaotic states of rf biased Josephson fluxonic diode

TL;DR

This paper investigates chaotic behaviors in a Josephson Fluxonic Diode under various conditions, identifying parameters that lead to chaos and mapping the boundaries of chaotic regions for potential microwave applications.

Contribution

It provides a detailed analysis of chaos in JFD using the RCSJ model, highlighting how loss, bias, and rf excitation influence the onset of chaos.

Findings

Chaos is suppressed below certain bias and rf excitation thresholds.

Loss term can induce chaos independently of rf frequency.

Chaotic regions are mapped in parameter space.

Abstract

The results of chaos simulations in Josephson Fluxonic Diode (JFD) subject to the magnetic field, rf driving and dc biasing currents in the RCSJ model are reported. The dynamic behavior of this nonlinear device is mapped as a function of loss, bias, frequency and amplitude of rf excitation which leads to find sustainable fluxon oscillation regions in microwave application. As a result, chaos does not happen if either the dc bias or the rf excitation is below specific value, but the loss term can change this state without affected by rf frequency. An attempt is made to explain the boundaries of the chaotic region in terms of parameter maps.