Thin and edgeless sensors for ATLAS pixel detector upgrade
Audrey Ducourthial (1), Marco Bomben (1), Giovanni Calderini (1),, Louis D'Eramo (1), Giovanni Marchiori (1), Ilaria Luise (1), Alvise Bagolini, (2), Maurizio Boscardin (2,3), Luciano Bosisio (4), Giovanni Darbo (7),, Gian-Franco Dalla Betta (3,6), Gabriele Giacomini (2,5)

TL;DR
This paper presents the development and testing of thin, edgeless planar pixel sensors with active edge technology for the ATLAS detector upgrade, aiming to improve efficiency and acceptance in high luminosity conditions.
Contribution
It reports on two new productions of thin, active-edge pixel sensors and their beam test performance before and after irradiation.
Findings
Sensors show high efficiency before irradiation.
Sensors maintain performance after irradiation.
Active edge technology reduces insensitive area.
Abstract
To cope with the harsh environment foreseen at the high luminosity conditions of HL- LHC, the ATLAS pixel detector has to be upgraded to be fully efficient with a good granularity, a maximized geometrical acceptance and an high read out rate. LPNHE, FBK and INFN are involved in the development of thin and edgeless planar pixel sensors in which the insensitive area at the border of the sensor is minimized thanks to the active edge technology. In this paper we report on two productions, a first one consisting of 200 {\mu}m thick n-on-p sensors with active edge, a second one composed of 100 and 130 {\mu}m thick n-on-p sensors. Those sensors have been tested on beam, both at CERN-SPS and at DESY and their performance before and after irradiation will be presented.
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