Functions to map photoelectron distributions in a variety of setups in angle-resolved photoemission spectroscopy

TL;DR

This paper develops explicit mapping functions for photoelectron distributions in angle-resolved photoemission spectroscopy, accommodating various apparatus configurations, including deflectors, and provides an algorithm for practical implementation.

Contribution

It introduces analytic forms of the inverse mapping function for different setups and presents a mapping algorithm applicable to multiple spectroscopic techniques.

Findings

Analytic inverse mapping functions are guaranteed for various setups.

A demonstrative mapping algorithm is provided.

The methodology can be applied to other spectroscopic methods.

Abstract

The distribution of photoelectrons acquired in angle-resolved photoemission spectroscopy can be mapped onto energy-momentum space of the Bloch electrons in the crystal. The explicit forms of the mapping function $f$ depend on the configuration of the apparatus as well as on the type of the photoelectron analyzer. We show that the existence of the analytic forms of $f^{\text{-}1}$ is guaranteed in a variety of setups. The variety includes the case when the analyzer is equipped with a photoelectron deflector. Thereby, we provide a demonstrative mapping program implemented by an algorithm that utilizes both $f$ and $f^{\text{-}1}$. The mapping methodology is also usable in other spectroscopic methods such as momentum-resolved electron-energy loss spectroscopy.