Intrinsically shunted Josephson junctions for electronics applications
M. Belogolovskii, E. Zhitlukhina, V. Lacquaniti, N. De Leo, M. Fretto,, A. Sosso

TL;DR
This paper explores the design of intrinsically shunted Josephson junctions with disordered interfaces, aiming to replace external shunts and improve superconducting electronics at 4.2 K.
Contribution
It proposes a new class of self-shunted Josephson devices with bimodal transmission distributions, reducing circuit complexity and parasitic inductance.
Findings
Potential for universal bimodal distribution in junctions
Advantages of self-shunted devices for practical applications
Promising operation at 4.2 K
Abstract
Conventional Josephson metal-insulator-metal devices are inherently underdamped and exhibit hysteretic current-voltage response due to a very high subgap resistance compared to that in the normal state. At the same time, overdamped junctions with single-valued characteristics are needed for most superconducting digital applications. The usual way to overcome the hysteretic behavior is to place an external low-resistance normal-metal shunt in parallel with each junction. Unfortunately, such solution results in a considerable complication of the circuitry design and introduces parasitic inductance through the junction. This paper provides a concise overview of some generic approaches that have been proposed in order to realize internal shunting in Josephson heterostructures with a barrier that itself contains the desired resistive component. The main attention is paid to self-shunted…
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