Detector requirements for single mask edge illumination x-ray phase contrast imaging applications
G. K. Kallon, F. A. Vittoria, M. Endrizzi, P.C. Diemoz, C.K. Hagen, A., Zamir, D. Basta, and A. Olivo

TL;DR
This paper discusses simplified detector setups for edge illumination X-ray phase contrast imaging, enabling single-shot multi-modal imaging to reduce acquisition time and errors, thus broadening application potential.
Contribution
It introduces two novel simplified set-ups leveraging advanced detector technology for single-shot multi-modal XPCI, improving efficiency and accuracy over traditional methods.
Findings
Achieved single-shot multi-modal imaging with simplified setups.
Reduced image acquisition time and errors in XPCI.
Enhanced potential for challenging imaging applications.
Abstract
Edge illumination (EI) is a non-interferometric X-ray phase contrast imaging (XPCI) method that has been successfully implemented with conventional polychromatic sources, thanks to its relaxed coherence requirements. Like other XPCI methods, EI enables the retrieval of absorption, refraction and ultra-small angle X-ray scattering (USAXS) signals. However, current retrieval algorithms require three input frames, which have so far been acquired under as many different illumination conditions, in separate exposures. These illumination conditions can be achieved by deliberately misaligning the set-up in different ways. Each one of these misaligned configurations can then be used to record frames containing a mixture of the absorption, refraction and scattering signals. However, this acquisition scheme involves lengthy exposure times, which can also introduce errors to the retrieved signals.…
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Advanced X-ray and CT Imaging · X-ray Spectroscopy and Fluorescence Analysis
