GaZn-VZn acceptor complex defect in Ga-doped ZnO
Aihua Tang, Zengxia Mei, Yaonan Hou, Lishu Liu, Vishnukanthan, Venkatachalapathy, Alexander Azarov, Andrej Kuznetsov, and Xiaolong Du

TL;DR
This study identifies and characterizes the (GaZn-VZn) acceptor complex defect in Ga-doped ZnO, revealing its role in compensation, energy levels, and optical properties, which could enable new defect-engineered optical applications.
Contribution
It provides a systematic experimental and theoretical analysis of the (GaZn-VZn) complex defect in Ga-doped ZnO, including its binding energy, energy levels, and optical emission properties.
Findings
High density of (GaZn-VZn) defect acts as a major compensator.
Binding energy (~0.78 eV) matches electrical activation energy (~0.82 eV).
Optical emission at ~650 nm with 10-20 ns lifetime.
Abstract
Identification of complex defect has been a long-sought-after physics problem for controlling the defect population and engineering the useful properties in wide bandgap oxide semiconductors. Here we report a systematic study of (GaZn-VZn)- acceptor complex defect via zinc self-diffusion in Ga-doped ZnO isotopic heterostructures, which were conceived and prepared with delicately controlled growth conditions. The secondary ion mass spectrometry and temperature-dependent Hall-effect measurements reveal that a high density of controllable (GaZn-VZn)- is the predominant compensating defect in Ga-doped ZnO. The binding energy of this complex defect obtained from zinc self-diffusion experiments (~0.78 eV) well matches the electrical activation energy derived from the temperature-dependent electrical measurements (~0.82 eV). The compensation ratios were quantitatively calculated by energetic…
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Taxonomy
TopicsZnO doping and properties · Ga2O3 and related materials · Electronic and Structural Properties of Oxides
