High-speed XYZ-nanopositioner for scanning ion conductance microscopy

TL;DR

This paper introduces a high-speed XYZ-nanopositioner optimized for scanning ion conductance microscopy, achieving rapid imaging with minimized vibrations and increased vertical tip velocity for efficient data acquisition.

Contribution

The design features a novel nanopipette mounting and mechanical amplification, significantly enhancing speed and stability in SICM imaging.

Findings

Resonance frequencies of ~100 kHz (Z) and ~2.3 kHz (XY)

Travel ranges of ~6 μm (Z) and ~34 μm (XY)

Vertical tip velocity up to 400 nm/ms

Abstract

We describe a tip-scan-type high-speed XYZ-nanopositioner designed for scanning ion conductance microscopy (SICM), with a special care being devoted to the way of nanopipette holding. The nanopipette probe is mounted in the center of a hollow piezoactuator, both ends of which are attached to identical diaphragm flexures, for Z-positioning. This design minimizes the generation of undesirable mechanical vibrations. Mechanical amplification is used to increase the XY-travel range of the nanopositioner. The first resonance frequencies of the nanopositioner are measured as $\sim$100 kHz and $\sim$2.3 kHz for the Z- and XY-displacements, respectively. The travel ranges are $\sim$6 $\mu$m and $\sim$34 $\mu$m for Z and XY, respectively. When this nanopositioner is used for hopping mode imaging of SICM with a $\sim$10-nm radius tip, the vertical tip velocity can be increased to 400 nm/ms; hence, the one-pixel acquisition time can be minimized to $\sim$1 ms.