Electric field induced semiconductor-to-metal phase transition in vertical MoTe2 and Mo1-xWxTe2 devices
Feng Zhang, Sergiy Krylyuk, Huairuo Zhang, Cory A. Milligan, Dmitry Y., Zemlyanov, Leonid A. Bendersky, Albert V. Davydov, Joerg Appenzeller

TL;DR
This paper demonstrates a reversible electric field-induced phase transition in ultrathin MoTe2 and Mo1-xWxTe2 devices, enabling electrical switching between semiconductor and metallic phases, with detailed nanoscale structural analysis and potential memory device applications.
Contribution
It reports the first experimental observation of electric field-induced reversible phase switching in vertical TMD devices, combining microscopy techniques to confirm phase changes and demonstrating tunable resistive memory behavior.
Findings
Reversible semiconductor-to-metal phase transition induced by electric field.
Structural confirmation of phase change via STM, STS, and STEM.
Demonstration of resistive memory devices with controllable switching voltages.
Abstract
Over the past years, transition metal dichalcogenides (TMDs) have attracted attention as potential building blocks for various electronic applications due to their atomically thin nature. An exciting development is the recent success in 'engineering' crystal phases of TMD compounds during the growth due to their polymorphic character. Here, we report an electric field induced reversible engineered phase transition in vertical 2H-MoTe2 devices, a crucial experimental finding that enables electrical phase switching for these ultra-thin layered materials. Scanning tunneling microscopy (STM) was utilized to analyze the TMD crystalline structure after applying an electric field, and scanning tunneling spectroscopy (STS) was employed to map a semiconductor-to-metal phase transition on the nanoscale. In addition, direct confirmation of a phase transition from 2H semiconductor to a distorted…
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Taxonomy
TopicsAdvanced Memory and Neural Computing · 2D Materials and Applications · Transition Metal Oxide Nanomaterials
