Highly sensitive optical sensor for precision measurement of electrical charges based on optomechanically induced difference-sideband generation
Hao Xiong, Zeng-Xing Liu, and Ying Wu

TL;DR
This paper proposes a highly sensitive all-optical sensor based on difference-sideband generation in an optomechanical system, capable of precisely measuring electrical charges with enhanced sensitivity and lower power consumption.
Contribution
It introduces a nonlinear optomechanical sensing mechanism that surpasses linearized methods, enabling higher precision charge detection in on-chip devices.
Findings
Difference-sideband generation exhibits exponential decay with electric interaction.
The sensor achieves higher sensitivity to electrical charges than traditional linear methods.
The approach is feasible with current experimental techniques in weak coupling regimes.
Abstract
Difference-sideband generation in an optomechanical system coupled to a charged object is investigated beyond the conventional linearized description of optomechanical interactions. An exponential decay law for difference-sideband generation in the presence of electric interaction is identified which exhibits more sensitivity to electrical charges than the conventional linearized effects. Using exact the same parameters with previous work based on the linearized dynamics of the optomechanical interactions, we show that optomechanically induced difference-sideband generation may enable an all-optical sensor for precision measurement of electrical charges with higher precision and lower power. The proposed mechanism is especially suited for on-chip optomechanical devices, where nonlinear optomechanical interaction in the weak coupling regime is within current experimental reach.
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