Analysis of quantum information processors using quantum metrology
Mark J. Kandula, Pieter Kok

TL;DR
This paper introduces a quantum metrological approach to evaluate and compare the sensitivity of different quantum device implementations to component variations, aiding in optimal design choices.
Contribution
It develops a general criterion using cost functions to assess and compare the robustness of quantum devices with respect to component variations.
Findings
Sensitivity of quantum devices can be expressed in a simple, general form.
The criterion helps decide between different physical implementations.
Comparison of sensitivities for specific optical quantum gates and detectors.
Abstract
Physical implementations of quantum information processing devices are generally not unique, and we are faced with the problem of choosing the best implementation. Here, we consider the sensitivity of quantum devices to variations in their different components. To measure this, we adopt a quantum metrological approach, and find that the sensitivity of a device to variations in a component has a particularly simple general form. We use the concept of cost functions to establish a general practical criterion to decide between two different physical implementations of the same quantum device consisting of a variety of components. We give two practical examples of sensitivities of quantum devices to variations in beam splitter transmitivities: the KLM and Reverse nonlinear sign gates for linear optical quantum computing with photonic qubits, and the enhanced optical Bell detectors by Grice…
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