Near-field edge fringes at sharp material boundaries
Viktoriia E. Babicheva, Sampath Gamage, Mark I. Stockman, Yohannes, Abate

TL;DR
This paper investigates the formation of near-field fringes at sharp material boundaries using advanced simulations and experiments, clarifying edge imaging mechanisms in layered and plasmonic materials with implications for near-field microscopy.
Contribution
It introduces a comprehensive simulation technique combining full-wave modeling and demodulation, enabling realistic edge imaging analysis in various materials with near-field microscopy.
Findings
Clarifies the origin of near-field fringes at sharp edges.
Distinguishes between resonant and non-resonant edge types.
Provides detailed analysis of edge fringes in layered and plasmonic materials.
Abstract
We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect conductor, and those that possess anisotropic permittivity and hyperbolic dispersion. For our theoretical analysis, we use a technique that combines full-wave numerical simulations of tip-sample near-field interaction and signal demodulation at higher orders akin to what is done in typical s-SNOM experiments. Unlike previous tip-sample interaction near-field models, our advanced technique allows simulation of the realistic tip and sample structure. Our analysis clarifies edge imaging of recently emerged layered materials such as hexagonal boron nitride and transition metal dichalcogenides (in particular, molybdenum disulfide), as well as traditional…
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