Design of a multifunctional sample probe for transport measurements and technological device characterizations

TL;DR

This paper presents a versatile sample probe designed for transport measurements and device characterizations, offering high control over magnetic, electrical, and thermal parameters with improved resolution over standard methods.

Contribution

The paper introduces a multifunctional sample probe with a two-axis goniometer, integrated control software, and compatibility with various systems, enhancing measurement flexibility and resolution.

Findings

Successful implementation in a dewar and electromagnet system

Enhanced resolution in magnetic measurements of ultra-thin films

Capability to perform temperature-dependent exchange bias studies

Abstract

We describe a multifunctional sample probe for transport measurements, equipped with a two-axis goniometer providing computer controlled 360${^\circ}$ out of plane and manual 360${^\circ}$ in-plane rotation. The multifunctional sample probe has been successfully implemented to a host dewar and electromagnet system. The developed probe is capable of performing transport measurements and device characterizations with high flexibility of controlling magnetic and electrical fields, angle, temperature and current/voltage parameters in a wide range. The design of the multifunctional sample probe allows easy connection of other external devices and easy installation into other dewar and magnet systems. A software interface based on NI Labview visual programming language has been developed to control the system. The setup has been tested in the hysteresis loop measurements of perpendicularly magnetized Co/Pt/CoO ultra-thin films with anomalous Hall effect (AHE) method. We have also performed temperature dependent exchange bias measurements of the samples. The developed probe revealed much better resolution in the case of perpendicularly magnetized ultra-thin Co/Pt/CoO films compared to a standard vibrating sample magnetometry system.