Velocity-map imaging for emittance characterization of multiphoton-emitted electrons from a gold surface
Hong Ye, Sebastian Trippel, Michele Di Fraia, Arya Fallahi, Oliver D., M\"ucke, Franz X. K\"artner, and Jochen K\"upper

TL;DR
This paper demonstrates a velocity-map imaging technique to characterize the transverse emittance of multiphoton-emitted electrons from a gold surface, providing detailed velocity distributions and emittance measurements.
Contribution
It introduces a method to reconstruct 3D velocity distributions from 2D images for emittance characterization of photoemitted electrons.
Findings
Reconstructed energy distribution aligns with Berglund-Spicer theory.
Measured transverse emittance is 0.52 and 0.05 π·mm·mrad in X and Y directions.
Method effectively characterizes electron bunch properties from gold surfaces.
Abstract
A velocity-map-imaging spectrometer is demonstrated to characterize the normalized transverse emittance of photoemitted electron bunches. The two-dimensional (2D) projected velocity distribution images of photoemitted electrons are recorded by the detection system and analyzed to obtain the normalized transverse emittance. With the presented distribution function of the electron photoemission angles a mathematical method is implemented to reconstruct the three-dimensional (3D) velocity distribution curve. As a first example, multiphoton emission from a planar Au surface is studied via irradiation at a glancing angle by intense 45 fs laser pulses at a central wavelength of 800 nm. The reconstructed energy distribution agrees very well with the Berglund-Spicer theory of photoemission. The normalized transverse emittance of the intrinsic electron bunch is characterized to be 0.52 and 0.05…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
