Properties of HPK UFSD after neutron irradiation up to 6e15 n/cm2
Z. Galloway, V. Fadeyev, P. Freeman, E. Gkougkousis, B. Gruey, C.A., Labitan, Z. Luce, F. McKinney-Martinez, H. F.-W. Sadrozinski, A. Seiden, E., Spencer, M. Wilder, N. Woods, A. Zatserklyaniy, Y. Zhao, N. Cartiglia, M., Ferrero, S. Giordanengo, M. Mandurrino, A. Staiano

TL;DR
This study investigates the effects of neutron irradiation up to 6e15 n/cm2 on HPK UFSD sensors, analyzing changes in gain, timing resolution, and pulse shape, revealing significant degradation but also insights into their radiation tolerance.
Contribution
It provides the first comprehensive analysis of HPK UFSD performance after high-fluence neutron irradiation, including experimental results and simulation comparisons.
Findings
Gain decreases from 80 to 7 after irradiation
Timing resolution worsens from 20 ps to 50 ps
Pulse shape changes align with simulation predictions
Abstract
In this paper we report results from a neutron irradiation campaign of Ultra-Fast Silicon Detectors (UFSD) with fluences of 1e14, 3e14, 6e14, 1e15, 3e15, 6e15 n/cm2. The UFSD used in this study are circular 50 micro-meter thick Low-Gain Avalanche Detectors (LGAD), with a 1.0 mm diameter active area. They have been produced by Hamamatsu Photonics (HPK), Japan, with pre-radiation internal gain in the range 10-100 depending on the bias voltage. The sensors were tested pre-irradiation and post-irradiation with minimum ionizing particle (MIPs) from a 90Sr based \b{eta}-source. The leakage current, internal gain and the timing resolution were measured as a function of bias voltage at -20C and -30C. The timing resolution was extracted from the time difference with a second calibrated UFSD in coincidence, using the constant fraction method for both. The dependence of the gain upon the…
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Taxonomy
TopicsParticle Detector Development and Performance · Radiation Detection and Scintillator Technologies · CCD and CMOS Imaging Sensors
