Noise suppression in inverse weak value based phase detection
Kevin Lyons, John C. Howell, Andrew N. Jordan

TL;DR
This paper investigates the robustness of inverse weak value-based phase measurements against common technical noise sources, demonstrating their resilience and applicability to optical frequency measurements.
Contribution
It shows that inverse weak value measurements are similarly robust to noise as traditional weak value experiments and can be extended to optical frequency measurements.
Findings
Robustness to additive Gaussian white noise
Resilience to angular jitter noise
Applicability to optical frequency measurements
Abstract
We examine the effect of different sources of technical noise on inverse weak value-based precision phase measurements. We find that this type of measurement is similarly robust to technical noise as related experiments in the weak value regime. In particular, the measurements considered here are robust to additive Gaussian white noise and angular jitter noise commonly encountered in optical experiments. Additionally, we show the same techniques used for precision phase measurement can be used with the same technical advantages for optical frequency measurements.
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