Characterizing Pixel and Point Patterns with a Hyperuniformity Disorder Length
A.T. Chieco, R. Dreyfus, and D.J. Durian

TL;DR
This paper introduces a new real-space method called Hyperuniformity Disorder Length Spectroscopy to characterize particle arrangements and fluctuations in pixel and point patterns, revealing different behaviors in various simulated systems.
Contribution
It defines the hyperuniformity disorder length to quantify density fluctuations and demonstrates its application across diverse pixel and point pattern models.
Findings
Random binomial patterns have long-range fluctuations with h=L/2.
Vacancy patterns show h=(L/2)(f/d) for small f.
Einstein patterns exhibit a constant h related to particle displacement.
Abstract
We introduce the concept of a hyperuniformity disorder length that controls the variance of volume fraction fluctuations for randomly placed windows of fixed size. In particular, fluctuations are determined by the average number of particles within a distance from the boundary of the window. We first compute special expectations and bounds in dimensions, and then illustrate the range of behavior of versus window size by analyzing three different types of simulated two-dimensional pixel pattern - where particle positions are stored as a binary digital image in which pixels have value zero/one if empty/contain a particle. The first are random binomial patterns, where pixels are randomly flipped from zero to one with probability equal to area fraction. These have long-ranged density fluctuations, and simulations confirm the exact result . Next we consider vacancy…
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