Transfer-matrix method for second-order nonlinear processes with realistic beams

TL;DR

This paper extends the transfer-matrix method to accurately model second-order nonlinear optical processes involving realistic, arbitrarily profiled beams in layered structures, overcoming limitations of traditional plane wave assumptions.

Contribution

The authors develop an extended transfer-matrix approach that handles arbitrary beam profiles and nonlinear effects, enabling more accurate simulations of complex optical phenomena.

Findings

Extended transfer-matrix method for nonlinear processes

Ability to model realistic beam profiles

Enhanced accuracy in layered structure simulations

Abstract

Accurate and fast modeling of electric fields in layered structures have a great scientific and practical value. Prevalent method for that is transfer-matrix method. However, transfer matrix method is limited to infinite plane wave calculations, which can become a limiting factor if a very narrow resonances, e.g. long range surface plasmon polaritons, are present in the structure. In this paper we extend the functionality of standard and nonlinear transfer-matrix method to include beams with arbitrary profile and propose applications for the method.