Structural and dielectric characterization of Sm2MgMnO6

TL;DR

This study synthesizes and characterizes Sm2MgMnO6, revealing its monoclinic structure, semiconducting behavior, and dielectric properties, with implications for electronic applications.

Contribution

It provides a detailed structural, optical, and dielectric analysis of Sm2MgMnO6 synthesized via sol-gel, including impedance modeling of conduction mechanisms.

Findings

Single-phase monoclinic structure confirmed by XRD

Semiconducting nature with specific band gap

Dielectric relaxation behavior characterized across frequencies

Abstract

The polycrystalline Sm2MgMnO6 (SMMO) was synthesized at 1173K by means of sol-gel technique. Rietveld refine-ment of X-ray diffraction (XRD) pattern confirmed the formation of a single phase monoclinic structure with space group P21/n. The band gap achieved from UV-vis spectra shows the semiconducting nature of the material. To observe the effect of grains and grain-boundaries in the conduction process and dielectric relaxation measurements are carried out on SMMO sample at different frequencies between 313 K and 673 K. An electrical equivalent circuit consisting of the resistance and constant phase element is used to clarify the impedance data.