Simulations of charge-breeding processes in ECRIS

TL;DR

This paper numerically simulates charge-breeding in ECRIS, analyzing efficiency, ion dynamics, and the impact of charge-exchange and wall recycling processes to improve understanding of ion source performance.

Contribution

It introduces a simulation approach using NAM-ECRIS parameters to study charge-breeding efficiency and ion dynamics in ECRIS.

Findings

Breeding efficiency varies with injection energy.

Saturation times are in the tens of milliseconds.

Charge-exchange and wall recycling significantly affect breeding.

Abstract

Charge-breeding processes in Electron Cyclotron Resonance Ion Sources are numerically simulated by using the target helium plasma parameters obtained with NAM-ECRIS code. Breeding efficiency is obtained as a function of 1+ ion injection energy for some alkali ion beams. Time dependencies of extracted ions are calculated; typical times for reaching saturation in currents are in the range of few tens of milliseconds. Role of charge-exchange processes in breeding of ions is discussed. Recycling of ions on the source walls is shown to be important.