Growth mechanism of cluster-assembled surfaces: from sub-monolayer to thin film regime
Francesca Borghi, Alessandro Podest\`a, Claudio Piazzoni, Paolo Milani

TL;DR
This study systematically investigates the growth mechanisms of cluster-assembled zirconia films from sub-monolayer to thin film, revealing that growth dynamics influence film morphology and roughness evolution.
Contribution
It provides the first detailed experimental analysis of the transition from sub-monolayer to thin film growth in cluster-assembled films using Atomic Force Microscopy.
Findings
Growth dynamics affect film morphology.
Roughness evolution follows ballistic deposition model.
Transition from sub-monolayer to thin film regime characterized.
Abstract
Nanostructured films obtained by the assembling of preformed atomic clusters are of strategic importance for a wide variety of applications. The deposition of clusters produced in the gas phase onto a substrate offers the possibility to control and engineer the structural and functional properties of the cluster-assembled films. To date the microscopic mechanisms underlying the growth and structuring of cluster-assembled films are poorly understood, and in particular the transition from the sub-monolayer to the thin film regime is experimentally unexplored. Here we report the systematic characterization by Atomic Force Microscopy of the evolution of the structural properties of cluster-assembled films deposited by Supersonic Cluster Beam Deposition. As a paradigm of nanostructured systems, we have focused our attention on cluster-assembled zirconia films, investigating the influence of…
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